Raman Spectrometer & Atomic Force Microscope

Raman Spectrometer

  • Three excitation laser wavelengths: 532 nm, 638 nm, 785 nm
  • Four gratings 600 gr, 1200 gr, 1800 gr, 2400 gr
  • Spectral resolution <1.4 cm -1
  • Upright confocal microscope
  • SWIFT mode scanning for fast mapping
  • Lateral resolution: 500 nm
  • TERS resolution: 15 nm

Atomic Force Microscope

  • STM, Conductive AFM. ranges 1 nA, 100 nA, 10 uA
  • Scanning range 100 um x100 um x 15 um
  • Vertical resolution: <1nm
  • Horizontal resolution: tip curvature dependant
  • Contact mode, Semi contact mode, non contact mode
  • Phase imaging, lateral force microscopy and force modulation
  • Kelvin Probe (surface potential microscopy)

Atomic force Microscopy combined with Raman

  • Direct Raman access from side and top allowing simultaneous Raman and AFM Measurements
  • The combination of AFM and Raman allows Tip Enhanced Raman Spectroscopy creating up to 15 nm resolution Raman.

Dr. Nathan Goodfriend

Postdoctoral Researcher: Nanomaterials; nathan.goodfriend(at)hilase.cz; +420 314 007 733