- Imaging resolution of 1.2 nm
- Accelerating voltage between 200 eV to 30 keV (down to 50 eV with BDT option)
- Multi‐Ported large (Ø 230 mm) specimen chamber
- Sputter coater for covering samples with a thin metal film for imaging insulating materials
- Scanning TEM system imaging (STEM) with a resolution down to 0.8 nm
- EDS elemental analysis, imaging and mapping
- Secondary electron detector
Prof. Dr. Alexander Bulgakov
Senior Researcher: Nanomaterials; alexander.bulgakov(at)hilase.cz; + 420 314 007 733
